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Simple Tester Probe Circuit

One may believe that a multimeter are used to test any electrical device, however this may not be always safe with semiconductors.

This article explains how to construct a simple harmless tester designed especially for semiconductors.

To test several semiconductor types this tester is simple to construct and uses a safe current level.

What is a Tester Probe Circuit:

The tester probe circuit is a handy measurement and testing tool which is used to quickly find out the functioning of an electrical circuit.

Also it is used to ensure that particular electrical equipment and components are in good operating condition.

Circuit Working:

Parts List:

CategoryDescriptionQuantity
Resistors150k CFR 1/4 W1
180k CFR 1/4 W1
10Ω CFR 1/4 W1
10k CFR 1/4 W1
100Ω CFR 1/4 W1
CapacitorsCeramic 47nF1
Electrolytic 1µF 25V1
SemiconductorsTransistors BC5471
Transistors 2N29071
Diodes 1N4148 (optional)2
Speaker1
Battery 9V1
Tester probes red1
Tester probes black1

T1 and T2 form a voltage controlled LF oscillator.

The loudspeaker acts as a load in the oscillator circuit.

The oscillator frequency is calculated by C1, R1, R4 and the external resistance between the measuring leads.

Resistor R3 serves as the collector resistance of T2 and C2 acts as low frequency decoupling for this resistor.

Oscillator Operation:

The oscillator frequency is adjusted for testing purposes.

There is no need to keep looking at the testing devices because the loudspeaker offers a sound throughout testing.

Safety Features:

The circuit makes sure that the device being tested is not harmed.

To keep the components of the tester safe from harm from the circuit being tested diodes D1 and D2 are included.

Power Efficiency:

When the testing probes are not electrically connected the circuit consumes very little current.

A longer battery life that is about equal to the batteries shelf life is ensured by this design.

Formulas:

The oscillation frequency (f) and the time constants related with these charging and discharging cycles have an equal correlation:

f = 1 / (Tcharge + Tdischarge)

where,

Analysis of Methods:

However one can conduct a qualitative examination of the circuit to identify the factors affecting the frequency and to calculate its range:

Charging Phase:

When the voltage across capacitor C decreases one BJT activates, allowing the capacitor to charge along a particular path indicated by the resistors.

The charging rate is decided by the charging current and the resistance value.

Discharging Phase:

When the capacitor reaches a certain voltage threshold the BJT changes features and turns off.

The capacitor can discharge into a second channel created by a fresh pair of resistors.

The discharge rate is also affected by the resistance that is present.

How to Build:

To build a Simple Tester Probe Circuit follow the below mentioned connections steps:

How to test:

Following are the few methods for testing the Tester Probe Circuit:

Power On:

Connect Measuring Leads:

Identify Test Points:

Touch Test Points:

Listen for Indication:

Disconnect and Repeat:

Verify Results:

Turn Off:

Conclusion:

This do-it-yourself method provides an accurate method to do silent testing without running the risk of damaging the circuit while being tested.

References:

Test probe

Datasheet 2N2907

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